Micro- and Nanoanalytics Group » Cryo-EM


With broad expertise in advanced microstructural and chemical analyses by SEM/FIB/TEM, we are currently focussing on the preparation, handling and characterization of environmentally and beam-sensitive materials (2D-(semi)conductors, batteries, MOFs, polymers). Therefore, sophisticated techniques like cryo-EM, inert-gas/vacuum sample handling and low-kV/low-dose TEM are exploited. Students and collaborators are highly welcome! Contacts: Dr. Christian Wiktor, Prof. Dr. Benjamin Butz

  • Y. Li, Y. Li, A. Pei, K. Yan, Y. Sun, C.-L. Wu, L.-M. Joubert, R. Chin, A.L. Koh, Y. Yu, J. Perrino, B. Butz, S. Chu, Y. Cui,
    Atomic structure of sensitive battery materials and interfaces revealed by cryo-electron microscopy,
    358 (2017), 506–510, DOI: 10.1126/science.aam6014

green: Established cryo sample preparation and handling routines

  • 12/’19 upgrade: LN2-Cryo-Upgrade for Leica Ultramicrotome UC7/FC7
  • 01/’20 upgrades: TEM transfer holders, imaging EEL spectrometer with highly sensitive CMOS camera
  • Spring ’20: self-built cryo cross-sectioning tool for organic devices like polymer batteries (current PEP project)

red (planned extention in ’20): Cryo-/inert-gas transfer between FIB/SEM –  glove box – e-beam PVD – OM – C-coater

Aktualisiert um 12:53 am 30. Dezember 2019 von Jonas Stötzel