Micro- and Nanoanalytics Group » in situ Electron microscopy
 

in situ Electron microscopy

Our group employs and develops in situ/in operando SEM and TEM techniques and devices to solve materials issues. With planned purchases, the methodical portfolio will range from heating (plus biasing) to environmental to mechanical testing within the SEM and TEM. Recent studies:

Batteries, fuel cells and related

Structure formation & Phase transformations

Failure

Latest in situ development

  • Development (in close collaboration with the Lehrstuhl für Umformtechnik, UTS) of miniaturized bending machine for in situ studies of phase transformations, crack initiation and growth: 3-point bending geometry to ensure most constant sample height; compatible with FEI Helios 600 FIB/SEM allowing for in situ imaging and crystallographic investigation by EBSD (support by Mr. Weiß, Kammrath & Weiss GmbH gratefully acknowledged)
  • Basic specs: max. load 4 kN, bending radius 1 mm, force & displacement measurement, dimensions 100 x 100 x 50 mm3, mass 700 g, sample dimensions 20 x 3.5 x 2 mm3
  • Contacts: Julian Müller, Rainer Steinheimer (UTS), Benjamin Butz
In situ bending experiment of a stainless steel sample
in situ bening in FIB/SEM

Aktualisiert um 12:52 am 17. April 2020 von Benjamin Butz