Micro- and Nanoanalytics Group » Fundamentals of TEM – Imaging & diffraction

Fundamentals of TEM – Imaging & diffraction

The lecture provides insights into general aspects of electron microscpy, how the instument forms an electron beam, how the beam interacts with a sample and how we can record and interpret the electron beam which has been altered by the sample. The summer lecture is focused on understanding how images and electron patterns are formed through illumination by a parallel electron beam. It will provide an understanding of the fundamental physical mechanisms, but also of the data being generated, i.e. what types of images can be formed, what we can learn from them and how diffraction and imaging are deeply connected in TEM.

The lecture has been recorded and is available via moodle („SoSe 2020 – Abbildende TEM und Elektronenbeugung“).

Aktualisiert um 16:24 am 30. Oktober 2020 von cw633536